4A 4mm KLEPS 30 Clamp Test Probe - Red

The HIRSCHMANN TEST AND MEASUREMENT 4A 4mm KLEPS 30 Clamp Test Probe in Red is a specialised spring probe connector designed for precision test and measurement applications. This point plunger probe features a gold-plated, full-hard beryllium copper contact, offering excellent electrical conductivity and corrosion resistance for reliable signal integrity.

With a compact profile, this probe is engineered for high-density testing environments. It boasts a 1.27mm minimum centre spacing, allowing for tight placement on circuit boards and test fixtures. The probe provides a full travel of 2.65mm, ensuring consistent contact even with slight variations in the height of the device under test.

Key Performance Features

• High Current Handling: Rated for 3A, making it suitable for a range of low to moderate current testing scenarios.
• Low Contact Resistance: Maintains a contact resistance of just 50mΩ, minimising voltage drop and signal loss for accurate measurements.
• Exceptional Durability: Built for repeated use with a minimum durability of 100,000 cycles, ensuring long-term reliability in production or laboratory settings.
• Secure Mounting: Designed for installation in a 0.9mm mounting hole, providing a stable and secure fit.
• Optimised Spring Force: Features an initial spring force of 120g, offering the right balance between ensuring positive contact and preventing damage to delicate components.

Constructed from gold over nickel-plated, full-hard beryllium copper, this probe combines mechanical strength with superior electrical performance. Its robust design makes it an indispensable tool for engineers and technicians involved in electronics development, quality assurance, and field service.