
Precise sprung-tip test probe for SMDs & small points. 30V AC/60V DC, 1A rating, 0.64mm connector system. Ideal for electronics testing.
The HIRSCHMANN MICRO-PRUEF MPS 2 Miniature Test Probe is engineered for the precise testing and measurement of modern electronics, particularly where space is at a premium. Its defining feature is a sprung stainless steel probe tip, which ensures reliable, constant contact pressure when sampling extremely small measuring points, including delicate surface-mount device (SMD) components. This spring-loaded design prevents the probe from slipping off during use, providing stable and accurate readings crucial for detailed circuit analysis.
Part of the versatile 0.64 mm connector system, this probe is compatible with connectors such as the MKL 0,64/25-0,25 and MAL N 4-0,64/100-0,25, facilitating easy integration into existing test setups. It is rated for a voltage of 30V AC or 60V DC and a current of 1A, adhering to measurement category O (3) according to IEC 61010 standards. This makes it suitable for circuits that are not directly connected to the mains supply, covering a wide range of low-voltage applications.
Constructed from durable PBT housing, the probe is built to withstand regular use in professional environments. It is designed for operation in normal environmental conditions, with a specified temperature range of -5°C to +40°C. Its compact and ergonomic design, complemented by a bright red housing for easy identification, allows for comfortable handling during prolonged testing sessions. This miniature test probe is an essential tool for electronics technicians, engineers, and hobbyists involved in prototyping, quality assurance, and circuit debugging.
Key Specifications
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