Hirschmann 2A 2mm Micro-Kleps Test Probe, Black

The Hirschmann 2A 2mm Micro-Kleps Test Probe is a precision miniature clamp-type probe designed for delicate testing applications in SMD technology. Its rotating grip jaws and insulated shaft (bendable up to 35°) allow for secure connections with very thin wires and densely packed contact points (1.27mm IC spacing pitch). This makes it ideal for intricate electronic work where standard probes may be too bulky.

The probe features a PBT housing material, ensuring durability and electrical insulation. With a 2A rated current and 30VAC/60VDC rated voltage, it is suitable for a variety of test scenarios under normal environmental conditions (-5°C to +40°C). Its gold-plated pin and tin-coated grip jaws provide reliable conductivity, while the UL 94 HB-rated housing offers additional safety assurance.

Specifications

• Connector Type: Test Probe
• Connector Tip Style: Grip Jaw
• Current Rating: 2A
• Rated Voltage: 30VAC/60VDC
• Measurement Category: O (for circuits not directly connected to mains)
• Temperature Range: -25°C to +100°C
• Contact Material: Spring steel (grip jaws), Brass (pin)
• Contact Surface Material: Tin (grip jaws), Gold (pin)
• Housing Material: PBT (UL 94 HB)
• Overall Length: 53.8mm

This probe is part of the Micro-Kleps product range, ensuring compatibility with MKL and MAL series connectors for seamless integration into your measurement setup.