Precision clamp-type test probe for SMD & thin wires. 2A, 30VAC/60VDC, rotating grip jaws. Ideal for electronics testing.
The Hirschmann 2A 2mm Micro-Kleps Miniature Clamp Test Probe is ideal for precise and reliable electrical measurements. Designed with a rotating grip jaw for SMD technology, it accommodates thin wires and densely packed contact points (even with a 1.27mm IC spacing pitch). The insulated shaft can be bent up to 35° for ease of access in tight spaces.
Built for durability and performance, this probe features a PBT housing and spring steel grip jaws with a brass pin. It operates safely under 30 VAC / 60 VDC rated voltage (for normal environmental conditions -5°C to +40°C) and a 2A rated current.
Key Features
A highly versatile tool for electronics testing, troubleshooting, and prototyping.
Free standard shipping on U.S. mainland orders. Express shipping options and international shipping available at checkout.
We offer a 30-day money-back guarantee on most products. For defective items, contact us within 14 days for a replacement or refund.
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