Hirschmann 2A 2mm Micro-Kleps Test Probe, Red
Precision clamp-type test probe for SMD & thin wires. 2A, 30VAC/60VDC, rotating grip jaws. Ideal for electronics testing.
The Hirschmann 2A 2mm Micro-Kleps Miniature Clamp Test Probe is ideal for precise and reliable electrical measurements. Designed with a rotating grip jaw for SMD technology, it accommodates thin wires and densely packed contact points (even with a 1.27mm IC spacing pitch). The insulated shaft can be bent up to 35° for ease of access in tight spaces.
Built for durability and performance, this probe features a PBT housing and spring steel grip jaws with a brass pin. It operates safely under 30 VAC / 60 VDC rated voltage (for normal environmental conditions -5°C to +40°C) and a 2A rated current.
Key Features
- Clamp-type test probe – Ensures secure connections to fine wires without slipping.
- 0.64mm system – Ideal for miniature electronics and PCB diagnostics.
- Wide temperature range (-25°C to +100°C) – Reliable performance in various conditions.
- Safety-rated for low-voltage circuits (Measurement Category O per IEC 61010) – Not intended for direct mains connection.
- Compact dimensions (53.8mm overall length) – Perfect for precision work in confined spaces.
A highly versatile tool for electronics testing, troubleshooting, and prototyping.
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- SMD technology applications
- Testing thin wires (0.64mm system)
- Densely packed PCB contact points
- Low-voltage circuit diagnostics
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- Rated Voltage: 30 VAC / 60 VDC (normal conditions -5°C to +40°C)
- Rated Current: 2A
- Measurement Category: O (IEC 61010, not for direct mains use)
- Temperature Range: -25°C to +100°C
- Contact Material (Grip Jaws): Spring steel, tin-plated
- Pin Material: Brass, nickel-plated
- Housing Material: PBT (UL 94 HB rated)
- Connector Type: Test Probe
- Connector Tip Style: Grip Jaw
- Overall Length: 53.8mm
- Product Range: MICRO-KLEPS
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